KUMAR, Vineet; GUPTA, Rahul. The reflected-shifted-truncated Maxwell distribution: properties and applications to reliability analysis. Brazilian Journal of Biometrics, [S. l.], v. 44, n. 1, p. e-44820, 2026. DOI: 10.28951/bjb.v44i1.820. Disponível em: http://www.cienciadainformacaoexpress.ufla.br/index.php/BBJ/article/view/820. Acesso em: 8 may. 2026.